Rising demand for CPO, SiPh reshapes semiconductor testing

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Rising demand for CPO, SiPh reshapes semiconductor testing

As chip power consumption, transmission speed and architectural complexity increase, testing has shifted from being a final pre-shipment quality gate to an earlier stage in product development and ramp-to-volume, according to KPMG managing director Jesse Chen, who previously worked at IBM and in venture capital. That shift is making testing a critical factor in product verification, yield ramp and supply chain stability.

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